Laboratory of
Photovoltaics and Optoelectronics, 
Faculty of Electrical Engineering
University of Ljubljana
Each year, beginning in 1998, workshops dedicated to a special topic are
included
to the programme of the MIDEM Conferences. During the workshop,
invited speakers present papers on the chosen topics from different aspects
within their special field, thus offering the audience valuable information.
Time for thorough discussions is provided between invited presentations.
Attendance at the workshop is included in the Conference registration fee.
For the year 2007, we are pleased to announce a
The MIDEM 2007 Workshop on Electronic Testing provides a forum for exchanging
ideas, discussing research results and presenting practical applications in the
areas of design, test and diagnosis of microelectronic circuits and systems.
The MIDEM 2007 Workshop on Electronic Testing is organized by MIDEM, Society for
Microelectronics, Devices and Materials and Jožef Stefan Institute, Ljubljana.
Topics of interest include but are not limited to :
Fault Modeling and Simulation
Test Generation and Compression
Design Verification/Validation
Diagnosis and Debug
Analog, Mixed-signal and RF Test
ATE Hardware and Software
Built-in-self-test ( BIST )
Design for Testability
Defect/Fault Tolerance and Reliability
System Test and Diagnosis
On-line Test
Memory and Processor Test
Embedded System Test
System-on-Chip Test
MEMS Test
Contact person for the Workshop on ELECTRONIC
TESTING
Franc Novak,
Jožef Stefan Institute, Ljubljana
Jamova 39, 1000 Ljubljana, Slovenia
Telefon: (01) 477 35 82
Faks: (01) 477 38 82
email:
franc.novak@ijs.si
MIDEM Conference 2007 homepage is edited by the
Laboratory of
Photovoltaics and Optoelectronics,
Faculty of Electrical Engineering
University of Ljubljana